发明名称 AUTOMATIC ANALYSIS APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To solve such various problems as contamination due to the adhesion of samples to the outside of a cleaning nozzle by the repeated use of the cleaning nozzle and reductions in cleaning effects due to nozzle clogging in an automatic analysis apparatus for processing a large number of samples in which reaction containers housing a reaction liquid are transferred to a cleaning station each time measurement is completed and repeatedly used while contamination between specimens is prevented by discharging and drawing a cleaning reagent by suction by a cleaning reagent nozzle and a suction nozzle (the cleaning nozzle). <P>SOLUTION: A nozzle cleaning mechanism is provided for cleaning the cleaning nozzle. By integrally moving the cleaning reagent nozzle and the suction nozzle and/or the nozzle cleaning mechanism and the cleaning station at this time, analysis time is not lengthened even if a cleaning process of the cleaning nozzle is added, and it is possible to speedily perform measurements. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010175414(A) 申请公布日期 2010.08.12
申请号 JP20090018940 申请日期 2009.01.30
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 OKUSA TAKENORI
分类号 G01N35/10 主分类号 G01N35/10
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