发明名称 High density trench MOSFET with single mask pre-defined gate and contact trenches
摘要 Trench gate MOSFET devices may be formed using a single mask to define gate trenches and body contact trenches. A hard mask is formed on a surface of a semiconductor substrate. A trench mask is applied on the hard mask to predefine a body contact trench and a gate trench. These predefined trenches are simultaneously etched into the substrate to a first predetermined depth. A gate trench mask is next applied on top of the hard mask. The gate trench mask covers the body contact trenches and has openings at the gate trenches that are wider than those trenches. The gate trench, but not the body contact trench, is etched to a second predetermined depth. Conductive material of a first kind may fill the gate trench to form a gate. Conductive material of a second kind may fill the body contact trench to form a body contact.
申请公布号 US7767526(B1) 申请公布日期 2010.08.03
申请号 US20090362414 申请日期 2009.01.29
申请人 ALPHA & OMEGA SEMICONDUCTOR INCORPORATED 发明人 LEE YEEHENG;CHANG HONG;LI TIESHENG;CHEN JOHN;BHALLA ANUP
分类号 H01L21/336 主分类号 H01L21/336
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