发明名称 Surface inspection method and surface inspection apparatus
摘要 A surface inspection method and a surface inspection apparatus in which a plurality of photodetectors are arranged in a plurality of directions so that light scattered, diffracted or reflected on a surface of an object to be inspected or in the vicinity of the surface is detected and a plurality of signals obtained by this are subjected to weighted addition processing or weighted averaging processing by linear combination.
申请公布号 US7764367(B2) 申请公布日期 2010.07.27
申请号 US20070834217 申请日期 2007.08.06
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MATSUI SHIGERU
分类号 G01N21/00 主分类号 G01N21/00
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