发明名称 OC DRAM CELL WITH INCREASED SENSE MARGIN
摘要 A memory device and method of making the memory device. The memory device comprises a storage transistor at a surface of a substrate. The storage transistor comprises a body portion between first and second source/drain regions, wherein the source/drain regions are regions of a first conductivity type. The storage transistor also comprises a gate structure that wraps at least partially around the body portion in at least two spatial planes. A bit line is connected to the first source/drain region and a word line is connected to the gate structure.
申请公布号 WO2010045087(A3) 申请公布日期 2010.07.15
申请号 WO2009US59943 申请日期 2009.10.08
申请人 MICRON TECHNOLOGY, INC.;MOULI, CHANDRA V.;SANDHU, GURTEJ S. 发明人 MOULI, CHANDRA V.;SANDHU, GURTEJ S.
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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