A memory device and method of making the memory device. The memory device comprises a storage transistor at a surface of a substrate. The storage transistor comprises a body portion between first and second source/drain regions, wherein the source/drain regions are regions of a first conductivity type. The storage transistor also comprises a gate structure that wraps at least partially around the body portion in at least two spatial planes. A bit line is connected to the first source/drain region and a word line is connected to the gate structure.
申请公布号
WO2010045087(A3)
申请公布日期
2010.07.15
申请号
WO2009US59943
申请日期
2009.10.08
申请人
MICRON TECHNOLOGY, INC.;MOULI, CHANDRA V.;SANDHU, GURTEJ S.