发明名称 INDUCTIVELY COUPLED PLASMA PROCESSING APPARATUS
摘要 An inductively coupled plasma processing apparatus includes a processing chamber for accommodating a target substrate to be processed and performing plasma processing thereon, a mounting table provided in the processing chamber for mounting thereon the target substrate, a processing gas supply system for supplying a processing gas into the processing chamber and a gas exhaust system for exhausting the inside of the processing chamber. Further, in the inductively coupled plasma processing apparatus, a high frequency antenna is provided to form an inductive electric field in the processing chamber and a first high frequency power supply is provided to supply a high frequency power to the high frequency antenna. A metal window made of a nonmagnetic and conductive material is formed between the high frequency antenna and the processing chamber while being insulated from a main body which forms the processing chamber.
申请公布号 US2010175831(A1) 申请公布日期 2010.07.15
申请号 US20100686756 申请日期 2010.01.13
申请人 TOKYO ELECTRON LIMITED 发明人 SASAKI KAZUO
分类号 C23F1/08;C23C16/00;C23C16/505 主分类号 C23F1/08
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