发明名称 METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a silicon carbide semiconductor device which provides a smooth surface of silicon carbide while keeping a high activation ratio of impurities. SOLUTION: This method of manufacturing a silicon carbide semiconductor device is used for forming an impurity region on a surface layer of a silicon carbide substrate. The method of manufacturing a silicon carbide semiconductor device includes processes of: implanting impurities into the surface layer of the silicon carbide substrate; forming a carbon film on a surface of the silicon carbide substrate; preliminarily heating the silicon carbide substrate by using the carbon film as a protective film; and activating and heat-treating the silicon carbide substrate by using the carbon film as a protective film. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010157546(A) 申请公布日期 2010.07.15
申请号 JP20080333658 申请日期 2008.12.26
申请人 SHOWA DENKO KK 发明人 SUZUKI KENJI
分类号 H01L21/265 主分类号 H01L21/265
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