| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical spectrum analyzer capable of measuring polarization characteristics of each wavelength or each frequency of light to be measured in addition to measurement of spectrum that is intensity characteristics of each wavelength or each frequency of the light to be measured. SOLUTION: The optical spectrum analyzer 1 includes: a depolarizer 12 disposed on an optical path of the light to be measured L0, rotatable about the optical path of the light to be measured L0, and splitting the light to be measured L0 into split light L1, L2 having polarization states orthogonal to each other; a diffraction grating 15 rotatable about an axis A1 crossing an incident surface of the split light L1, L2 and dispersing the split light L1, L2 split by the depolarizer 12; a light receiving unit 20 receiving the individual prescribed wavelength components of the split light L1, L2 dispersed by the diffraction grating 15 and for output of respective light-receiving signals; and a signal processing unit 30 applying prescribed signal processing to the light-receiving signals output from the light receiving unit 20 to obtain the polarization characteristics of the light to be measured L0. COPYRIGHT: (C)2010,JPO&INPIT
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