| 摘要 |
PURPOSE: A test apparatus is provided to improve test coverage by control point insertion because a control register is formed in an isolation section considering a toggle rate. CONSTITUTION: A MUX(440) selectively outputs an input signal of a logic circuit(420). A control register(450) selectively outputs an input signal of a MUX. A flip-flop receives a clock signal and outputs a signal to the logic circuit. The control register receives a test clock signal and outputs a control signal to the MUX. The MUX selectively switches the path of a signal according to a control signal of the control resister. |
