发明名称 METALIZED ELASTOMERIC PROBE STRUCTURE
摘要 Techniques for forming enhanced electrical connections are provided. In one aspect, an electrical connecting device comprises an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure comprises an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier.
申请公布号 KR100968183(B1) 申请公布日期 2010.07.05
申请号 KR20077013681 申请日期 2005.09.30
申请人 发明人
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项
地址