发明名称 METHOD FOR FORMING NITRIDED SILICON FILM WITH IMPROVED UV TRANSMISSION PROPERTIES AND SEMICONDUCTOR DEVICE COMPRISING THE SAME
摘要 PURPOSE: A method for forming a silicon nitride film with an improved UV transmission property and a semiconductor device comprising the same are provided to reduce the refractive index and the absorbent index of the semiconductor device without a silicon nitroxide film by changing the chemical composition of the silicon nitride film. CONSTITUTION: A silicon nitride film is formed by injecting a precursor gas containing silicon source and a precursor gas containing nitrogen source into a plasma chamber. Under a condition which RF power is between 400 to 600W, nitrogen gas and hydrogen gas are injected in order to reduce the equivalent of silicon in the silicon nitride film. A process for forming the silicon nitride film and a process for reducing the equivalent of the silicon in the silicon nitride film are successively repeated.
申请公布号 KR20100074491(A) 申请公布日期 2010.07.02
申请号 KR20080132948 申请日期 2008.12.24
申请人 DONGBU HITEK CO., LTD. 发明人 KWON, SOON GYU
分类号 H01L21/205;H01L21/8247 主分类号 H01L21/205
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