发明名称 |
MANUFACTURING METHOD FOR ISOLATION STRUCTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing the element isolation structure is provided to improve the gap-filling property of a gap-filling insulating film by modifying the aspect ratio of a trench. CONSTITUTION: A trench(109) is formed in an element isolation region of a semiconductor substrate. A gate insulating film(103) and a conductive film are stacked on the active region of the semiconductor substrate. A poly-silicon film(113) is formed on the surface of the semiconductor substrate including the trench. A gap-filling insulating film is formed to fill the trench. The poly-silicon film and the gap-filling insulating film are oxidized.
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申请公布号 |
KR20100074668(A) |
申请公布日期 |
2010.07.02 |
申请号 |
KR20080133158 |
申请日期 |
2008.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SEO, YOUNG HEE;LIM, JUNG YEON |
分类号 |
H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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