发明名称 MANUFACTURING METHOD FOR ISOLATION STRUCTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing the element isolation structure is provided to improve the gap-filling property of a gap-filling insulating film by modifying the aspect ratio of a trench. CONSTITUTION: A trench(109) is formed in an element isolation region of a semiconductor substrate. A gate insulating film(103) and a conductive film are stacked on the active region of the semiconductor substrate. A poly-silicon film(113) is formed on the surface of the semiconductor substrate including the trench. A gap-filling insulating film is formed to fill the trench. The poly-silicon film and the gap-filling insulating film are oxidized.
申请公布号 KR20100074668(A) 申请公布日期 2010.07.02
申请号 KR20080133158 申请日期 2008.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SEO, YOUNG HEE;LIM, JUNG YEON
分类号 H01L21/76 主分类号 H01L21/76
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