发明名称 DOUBLE PASS FORMATION OF A DEEP QUANTUM WELL IN ENHANCEMENT MODE III-V DEVICES
摘要 A quantum well is formed for a deep well III-V semiconductor device using double pass patterning. In one example, the well is formed by forming a first photolithography pattern over terminals on a material stack, etching a well between the terminals using the first photolithography patterning, removing the first photolithography pattern, forming a second photolithography pattern over the terminals and at least a portion of the well, deepening the well between the terminals by etching using the second photolithography pattern, removing the second photolithography pattern, and finishing the terminals and the well to form a device on the material stack.
申请公布号 US2010163849(A1) 申请公布日期 2010.07.01
申请号 US20080347925 申请日期 2008.12.31
申请人 RADOSAVLIJEVIC MARKO;CHU-KUNG BENJAMIN;HUDAIT MANTU K;PILLARISETTY RAVI 发明人 RADOSAVLIJEVIC MARKO;CHU-KUNG BENJAMIN;HUDAIT MANTU K.;PILLARISETTY RAVI
分类号 H01L29/12;G03F7/20;H01L21/336 主分类号 H01L29/12
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