发明名称 STANDARD MECHANICAL INTERFACE WITH WAFER MAPPING SYSTEM
摘要 PURPOSE: A standard mechanical interface with a wafer mapping system is provided to prevent the scrap of a normal wafer by monitoring not only the amount of the wafer though a wafer mapping but also the state of the wafer. CONSTITUTION: An elevator module(110) is connected to an SMIF(Standard Mechanical Interface) arm(30). A first sensor(120) is installed in one side of the elevator module. A second sensor is installed in the other side of the elevator module. A controller is connected to the first and the second sensor to switch the power of the SMIF(Standard Mechanical Interface). The first sensor and the second sensor use a proximity sensor.
申请公布号 KR20100073319(A) 申请公布日期 2010.07.01
申请号 KR20080131952 申请日期 2008.12.23
申请人 DONGBU HITEK CO., LTD. 发明人 SONG, YOUNG HWAN
分类号 H01L21/00 主分类号 H01L21/00
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