ARRANGEMENT FOR UNAFFECTED MATERIAL ANALYSIS

摘要

This invention concerns a method for the unaffected material analyse for detection and analysis of at least one material deviation in a material 2. The method is characterised by the detection of a region 1 with a difference in hardness in the material 2 through the use of a tactile sensor 4 that is placed in contact with the material, illumination of the detected area with chromatographic light A in order to obtain reflected light B in the form of a light spectrum, and analysis of the obtained light spectrum in order to obtain information concerning the physical and chemical molecular structure of the material. The invention concerns also an arrangement.