发明名称 Method and apparatus of high-speed input sampling
摘要 A signal sampler and method for high-speed input sampling of a signal are disclosed. A first sampler samples a data signal at a rising edge of a clock signal and generates a first sampled signal. A second sampler samples the data signal at a falling edge of an inverted clock signal and generates a second sampled signal. The first and second sampled signals may be combined to determine the next signal sampler output. An evaluation may include asserting the output signal if the first and second sampled signals are asserted, negating the output signal if the first and second sampled signals are negated, and toggling the output signal if the first and second sampled signals are in opposite logic states. The signal sampler and method of signal sampling may be incorporated in a semiconductor device, which may be fabricated on a semiconductor wafer and included in an electronic system.
申请公布号 US7747890(B2) 申请公布日期 2010.06.29
申请号 US20060590582 申请日期 2006.10.31
申请人 MICRON TECHNOLOGY, INC. 发明人 LEE SEONGHOON
分类号 G06F1/04 主分类号 G06F1/04
代理机构 代理人
主权项
地址