发明名称 Method for puncturing low density parity check code
摘要 A method is provided for puncturing a low density parity check (LDPC) code decoded by a parity check matrix that is expressed by a factor graph including a check node and a bit node, being connected to each other at an edge, and includes a parity part having a dual diagonal matrix with a single 3-weight column and the remaining columns being 2-weight columns. The method includes generating a puncturing pattern such that bits of the LDPC code are punctured in an order of a bit mapped to a column with a higher weight from among the columns constituting the parity part; and puncturing the LDPC code according to the generated puncturing pattern.
申请公布号 US7743312(B2) 申请公布日期 2010.06.22
申请号 US20060367521 申请日期 2006.03.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI EOI-YOUNG;SUH SEUNG-BUM
分类号 H03M13/03 主分类号 H03M13/03
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