发明名称 |
Method for puncturing low density parity check code |
摘要 |
A method is provided for puncturing a low density parity check (LDPC) code decoded by a parity check matrix that is expressed by a factor graph including a check node and a bit node, being connected to each other at an edge, and includes a parity part having a dual diagonal matrix with a single 3-weight column and the remaining columns being 2-weight columns. The method includes generating a puncturing pattern such that bits of the LDPC code are punctured in an order of a bit mapped to a column with a higher weight from among the columns constituting the parity part; and puncturing the LDPC code according to the generated puncturing pattern.
|
申请公布号 |
US7743312(B2) |
申请公布日期 |
2010.06.22 |
申请号 |
US20060367521 |
申请日期 |
2006.03.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI EOI-YOUNG;SUH SEUNG-BUM |
分类号 |
H03M13/03 |
主分类号 |
H03M13/03 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|