发明名称 Differential-Pressure Dual Ion Trap Mass Analyzer And Methods Of Use Thereof
摘要 A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies.
申请公布号 US2010148063(A1) 申请公布日期 2010.06.17
申请号 US20100710245 申请日期 2010.02.22
申请人 SCHWARTZ JAE C;SYKA JOHN E P;QUARMBY SCOTT T 发明人 SCHWARTZ JAE C.;SYKA JOHN E.P.;QUARMBY SCOTT T.
分类号 H01J49/26 主分类号 H01J49/26
代理机构 代理人
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