发明名称 Method for manufacturing the shallow trench isolation structure
摘要 A method for manufacturing a shallow trench isolation (STI) structure is provided. In the method, a substrate is initially provided. Then, a patterned pad layer and a patterned mask layer are successively formed in order on the substrate. After that, a portion of the substrate is removed by using the patterned mask layer and the patterned pad layer as a mask to form trenches in the substrate. Next, a first insulation layer is formed in the trenches. Afterwards, a protection layer is conformally formed on the substrate. Then, a second insulation layer is formed on the protection layer above the first insulation layer. Next, the patterned mask layer and the patterned pad layer are removed. Finally, a portion of the protection layer and the second insulation layer are removed.
申请公布号 US7732337(B2) 申请公布日期 2010.06.08
申请号 US20070834024 申请日期 2007.08.06
申请人 NANYA TECHNOLOGY CORPORATION 发明人 WANG JIANN-JONG;CHUNG CHI-LONG
分类号 H01L21/302 主分类号 H01L21/302
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