发明名称 Clock distribution circuit and test method
摘要 A clock distribution circuit having plural stages of buffers disposed along branch paths for dividing up a clock signal and configured in a manner that outputs of a plurality of buffers in a final stage and/or a middle stage are short-circuited, includes in relation to at least one buffer of a plurality of buffers in the same stage on a branch path, a selector for receiving an output of an adjacent buffer located upstream in terms of chain-connection along which the plurality of buffers are connected in testing, and a signal at a branch node corresponding to the at least one buffer by a first input and a second input respectively, selecting one of the first input and the second input based on a select control signal, and supplying the selected input to the one buffer.
申请公布号 US7733079(B2) 申请公布日期 2010.06.08
申请号 US20070902746 申请日期 2007.09.25
申请人 NEC ELECTRONICS COFRPORATION 发明人 NAKASHIMA HIDEMI
分类号 G01R19/00 主分类号 G01R19/00
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