发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR ELEMENT
摘要 <p>A method is provided for manufacturing a semiconductor device having a multilayer wiring structure in which at least one insulating film is formed with a set of conducting portions which are electrically connected to each other to have a surface area of no less than 500 mu m<2> and which include a wiring having a width of no more than 1.0 mu m. The method includes a polishing step (501) for flattening the conducting portions together with the insulating film by chemical mechanical polishing, a chemical cleaning step (502) for cleaning the flattened surface of the insulating film with a cleaning liquid, and a rising step (503) for removing the cleaning liquid using a rinsing liquid. The rinsing step is performed using water with a dissolved oxygen concentration decreased to no more than 6ppm by weight as the rinsing liquid. <IMAGE></p>
申请公布号 EP1310988(B1) 申请公布日期 2010.05.26
申请号 EP20000940828 申请日期 2000.06.23
申请人 FUJITSU LIMITED 发明人 HORIUCHI, HIROSHI;YAMAMOTO, TAMOTSU;TAKIGAWA, YUKIO;SUZUKI, SHIGERU;SANTO, NOBUAKI;MIYAJIMA, MOTOSHU
分类号 H01L21/3205;H01L21/02;H01L21/321;H01L21/768;H01L23/532 主分类号 H01L21/3205
代理机构 代理人
主权项
地址