发明名称
摘要 <P>PROBLEM TO BE SOLVED: To supply method/device of silicon wafer abrasive with which classification is performed from abrasive where distribution width of a grain size is wide with a simple method and abrasive after classification can efficiently be supplied to the wrapping process of a wafer. Ž<P>SOLUTION: Dispersion solution and abrasive are supplied to a separation tank 2, and they are stirred and mixed. Abrasive dispersed in dispersion solution is settled while stirring speed is controlled. Settled abrasive is extracted with dispersion solution from a plurality of liquid take-out ports 14a, 14b and 14c arranged by leaving intervals along a depthwise direction of the separation tank 2, and it is set to be classified slurry. Classified slurry is supplied to the wrapping process of the silicon wafer. Ž<P>COPYRIGHT: (C)2006,JPO&NCIPI Ž
申请公布号 JP4466312(B2) 申请公布日期 2010.05.26
申请号 JP20040304127 申请日期 2004.10.19
申请人 发明人
分类号 H01L21/304;B24B37/00;B24B57/02 主分类号 H01L21/304
代理机构 代理人
主权项
地址
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