发明名称 HIGH INTEGRATED PHASE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A high integrated phase change memory device and a method for manufacturing the same are provided to utilize a space between diodes by forming the triangle structure of diodes through a double photo lithography process. CONSTITUTION: An interlayer insulation layer(110) is formed on the upper side of a semiconductor substrate. A plurality of diodes is formed in the interlayer insulation layer. The upper surface of the diodes is a triangle shape. The diodes are spaced apart from each other with a pre-set gap and are arranged in a matrix shape. The upper oblique sides of adjacent diodes are arranged in parallel.</p>
申请公布号 KR20100053793(A) 申请公布日期 2010.05.24
申请号 KR20080112589 申请日期 2008.11.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, JUN HYUNG;KWON, KI SUNG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址