发明名称 |
HIGH INTEGRATED PHASE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>PURPOSE: A high integrated phase change memory device and a method for manufacturing the same are provided to utilize a space between diodes by forming the triangle structure of diodes through a double photo lithography process. CONSTITUTION: An interlayer insulation layer(110) is formed on the upper side of a semiconductor substrate. A plurality of diodes is formed in the interlayer insulation layer. The upper surface of the diodes is a triangle shape. The diodes are spaced apart from each other with a pre-set gap and are arranged in a matrix shape. The upper oblique sides of adjacent diodes are arranged in parallel.</p> |
申请公布号 |
KR20100053793(A) |
申请公布日期 |
2010.05.24 |
申请号 |
KR20080112589 |
申请日期 |
2008.11.13 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, JUN HYUNG;KWON, KI SUNG |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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