发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To improve the coatability or loading effect of an oxide film without increasing the supply amount or supply time of an oxidant. Ž<P>SOLUTION: The method of manufacturing a semiconductor device includes a substrate loading step of loading at least one substrate to a processing chamber; an oxide film forming step of forming an oxide film on the substrate by alternately supplying a first reaction material and a second reaction material containing oxygen atoms to the processing chamber while heating the substrate; and a substrate unloading step of unloading the substrate from the processing chamber, wherein the forming of the oxide film is performed by keeping the substrate at a temperature equal to or lower than a self-decomposition temperature of the first reaction material and by irradiating the second reaction material with ultraviolet light. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010114420(A) 申请公布日期 2010.05.20
申请号 JP20090179630 申请日期 2009.07.31
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 MIYA HIRONOBU;SAKAI MASANORI;MIZUNO KANEKAZU;TOYODA KAZUYUKI;TAKEBAYASHI YUJI;KATO TSUTOMU;ONO KENJI;MORIKAWA ATSUSHI;OKADA ITARU
分类号 H01L21/316;C23C16/452;H01L21/31;H01L21/8242;H01L27/108 主分类号 H01L21/316
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