发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To improve the coatability or loading effect of an oxide film without increasing the supply amount or supply time of an oxidant. Ž<P>SOLUTION: The method of manufacturing a semiconductor device includes a substrate loading step of loading at least one substrate to a processing chamber; an oxide film forming step of forming an oxide film on the substrate by alternately supplying a first reaction material and a second reaction material containing oxygen atoms to the processing chamber while heating the substrate; and a substrate unloading step of unloading the substrate from the processing chamber, wherein the forming of the oxide film is performed by keeping the substrate at a temperature equal to or lower than a self-decomposition temperature of the first reaction material and by irradiating the second reaction material with ultraviolet light. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010114420(A) |
申请公布日期 |
2010.05.20 |
申请号 |
JP20090179630 |
申请日期 |
2009.07.31 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
MIYA HIRONOBU;SAKAI MASANORI;MIZUNO KANEKAZU;TOYODA KAZUYUKI;TAKEBAYASHI YUJI;KATO TSUTOMU;ONO KENJI;MORIKAWA ATSUSHI;OKADA ITARU |
分类号 |
H01L21/316;C23C16/452;H01L21/31;H01L21/8242;H01L27/108 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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