发明名称 Multiple access test points
摘要 Included are systems and methods for providing access of test points. An embodiment of a system includes an electrical module including at least one electrical circuit configured to communicate at least one electrical signal, the electrical module further including at least one multiple access test point configured to provide access for measurements of the electrical circuit. Some embodiments include an environmental housing that includes at least one access port, the environmental housing configured to receive the electrical module such that at least one access port provides access to at least one multiple access test point.
申请公布号 US7719849(B2) 申请公布日期 2010.05.18
申请号 US20060482435 申请日期 2006.07.07
申请人 SCIENTIFIC-ATLANTA, INC. 发明人 BLASHEWSKI STEVEN E.;RIGGSBY ROBERT R.;MAHONEY WILLIAM G.
分类号 H05K5/02 主分类号 H05K5/02
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