发明名称 JTAG controlled self-repair after packaging
摘要 An integrated circuit containing memory includes IEEE 1149.1 (JTAG) controlled self-repair system that permits permanent repair of the memory after the integrated circuit has been packaged. The JTAG controlled self-repair system allows a user to direct circuitry to blow fuses using an externally supplied voltage to electrically couple or isolate components to permanently repair a memory location with JTAG standard TMS and TCK signals. The system may optionally sequentially repair more than one memory location using a repair sequencer.
申请公布号 US7721163(B2) 申请公布日期 2010.05.18
申请号 US20070789367 申请日期 2007.04.23
申请人 MICRON TECHNOLOGY, INC. 发明人 FUJIWARA YOSHINORI;NOMURA MASAYOSHI
分类号 G11C29/00;G01R31/28;G11C17/18 主分类号 G11C29/00
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