发明名称 |
JTAG controlled self-repair after packaging |
摘要 |
An integrated circuit containing memory includes IEEE 1149.1 (JTAG) controlled self-repair system that permits permanent repair of the memory after the integrated circuit has been packaged. The JTAG controlled self-repair system allows a user to direct circuitry to blow fuses using an externally supplied voltage to electrically couple or isolate components to permanently repair a memory location with JTAG standard TMS and TCK signals. The system may optionally sequentially repair more than one memory location using a repair sequencer.
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申请公布号 |
US7721163(B2) |
申请公布日期 |
2010.05.18 |
申请号 |
US20070789367 |
申请日期 |
2007.04.23 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
FUJIWARA YOSHINORI;NOMURA MASAYOSHI |
分类号 |
G11C29/00;G01R31/28;G11C17/18 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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