发明名称 MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD TO DESIGN OPTICAL SURFACE
摘要 <P>PROBLEM TO BE SOLVED: To improve an optical system which can be used as a projection objective mirror in a microlithography projection aligner concerning resolution in illumination wavelengths. <P>SOLUTION: The microlithography projection optical system (101) includes a plurality of elements arranged to image radiation from an object plane (103) to an image plane (102), at least one of the elements being a reflective element that has a rotationally asymmetric surface positioned in a path of the radiation. The rotationally asymmetric surface deviates from a rotationally symmetric surface by about 10 nm or more. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010107988(A) 申请公布日期 2010.05.13
申请号 JP20090265616 申请日期 2009.10.30
申请人 CARL ZEISS SMT AG 发明人 MANN HANS-JUERGEN;ULRICH WILHELM;PRETORIUS MARCO
分类号 G02B17/00;G02B13/18;G03F7/20;H01L21/027 主分类号 G02B17/00
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