发明名称 |
MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD TO DESIGN OPTICAL SURFACE |
摘要 |
<P>PROBLEM TO BE SOLVED: To improve an optical system which can be used as a projection objective mirror in a microlithography projection aligner concerning resolution in illumination wavelengths. <P>SOLUTION: The microlithography projection optical system (101) includes a plurality of elements arranged to image radiation from an object plane (103) to an image plane (102), at least one of the elements being a reflective element that has a rotationally asymmetric surface positioned in a path of the radiation. The rotationally asymmetric surface deviates from a rotationally symmetric surface by about 10 nm or more. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010107988(A) |
申请公布日期 |
2010.05.13 |
申请号 |
JP20090265616 |
申请日期 |
2009.10.30 |
申请人 |
CARL ZEISS SMT AG |
发明人 |
MANN HANS-JUERGEN;ULRICH WILHELM;PRETORIUS MARCO |
分类号 |
G02B17/00;G02B13/18;G03F7/20;H01L21/027 |
主分类号 |
G02B17/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|