发明名称 |
X-Ray Analysis Instrument |
摘要 |
An apparatus for carrying out both x-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis of a crystalline sample. A sample holder is located within an evacuable chamber. An x-ray fluorescence source and separate x-ray diffraction source are mounted within the evacuable chamber. An XRF detection arrangement is also provided, for detecting secondary x-rays emitted from the surface of the crystalline sample as a result of illumination by x-rays from the said x-ray fluorescence source. An XRD detection arrangement is then provided for detecting x-rays of a characteristic wavelength which have been diffracted by the crystalline sample. A moveable XRD support assembly is provided, comprising a first part configured to mount the XRD source for relative movement between the XRD source and the sample holder, and a second part configured to mount the XRD detection arrangement for relative movement between the XRD detection arrangement and the sample holder.
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申请公布号 |
US2010111251(A1) |
申请公布日期 |
2010.05.06 |
申请号 |
US20080529114 |
申请日期 |
2008.02.28 |
申请人 |
YELLEPEDDI RAVISEKHAR;NEGRO PIERRE-YVES;BONZON MICHEL |
发明人 |
YELLEPEDDI RAVISEKHAR;NEGRO PIERRE-YVES;BONZON MICHEL |
分类号 |
G01N23/223;G01N23/20;G01N23/22 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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