发明名称 SYSTEM, COMPUTER PROGRAM PRODUCT AND METHOD FOR TESTING A LOGIC CIRCUIT
摘要 A system for testing a logic circuit which has two or more test routine modules. Each module contains a set of instructions which is executable by (a part of) the logic circuit. The set forms a test routine for performing a self-test by the part of the logic circuit. The self-test includes the part of the logic circuit testing itself for faulty behaviour, and the part of the logic circuit determining a self-test result of the testing. The system includes a test module which can execute a test application which subjects the logic circuit to a test by performing the self-test on at least a part of the logic circuit by causes the part of the logic circuit to execute a selected test routine, and determining, by the test module, an overall test result at least based on a performed self-tests. The test module includes a control output interface for activates the execution of the a selected test routine. A second test module input interface can receive the self-test result from a selected test routine. At a test module output interface the overall test result may be outputted. The test routine includes instructions for outputting, by the part of the logic circuit, data to a test routine output interface which is not connected to the second test module input interface, for outputting information about the self-test result by the test routines without passing the information through the test module.
申请公布号 US2010107025(A1) 申请公布日期 2010.04.29
申请号 US20070527347 申请日期 2007.02.16
申请人 FREESCALE SEMICONDUCTOR, INC 发明人 SAKADA OLEKSANDR;BOGENBERGER FLORIAN
分类号 G01R31/3177;G06F11/25 主分类号 G01R31/3177
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