发明名称 SEMICONDUCTOR DEVICE AND FORMING METHOD THEREFOR
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve reliability of the semiconductor device by improving uniformity of a metal wiring formed on the upper side of the seed layer. CONSTITUTION: A lower substructure is formed on a semiconductor substrate. The interlayer insulation layer has a trench pattern formed on the semiconductor substrate. A metal movement suppressing layer(116) is electrically connected to the lower structure along the trench pattern. A seed layer(118) is formed on the metal movement suppressing layer along the trench pattern. The metal wiring is formed on the seed layer to bury the trench pattern.
申请公布号 KR20100042940(A) 申请公布日期 2010.04.27
申请号 KR20080102162 申请日期 2008.10.17
申请人 DONGBU HITEK CO., LTD. 发明人 SHIN, JONG HOON;LEE, HAN CHOON
分类号 H01L21/28;H01L21/768 主分类号 H01L21/28
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