发明名称 |
SEMICONDUCTOR DEVICE AND FORMING METHOD THEREFOR |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve reliability of the semiconductor device by improving uniformity of a metal wiring formed on the upper side of the seed layer. CONSTITUTION: A lower substructure is formed on a semiconductor substrate. The interlayer insulation layer has a trench pattern formed on the semiconductor substrate. A metal movement suppressing layer(116) is electrically connected to the lower structure along the trench pattern. A seed layer(118) is formed on the metal movement suppressing layer along the trench pattern. The metal wiring is formed on the seed layer to bury the trench pattern.
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申请公布号 |
KR20100042940(A) |
申请公布日期 |
2010.04.27 |
申请号 |
KR20080102162 |
申请日期 |
2008.10.17 |
申请人 |
DONGBU HITEK CO., LTD. |
发明人 |
SHIN, JONG HOON;LEE, HAN CHOON |
分类号 |
H01L21/28;H01L21/768 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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