发明名称 SYSTEM FOR NON CONTACT CLEANING, LITHOGRAPHY DEVICE, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a system for performing non contact cleaning of the surface of an object, a lithography device including the system, and a device manufacturing method. <P>SOLUTION: The system may include: a He plasma source contained in a chamber; and a control unit configured so as to correct plasma parameters such as an electronic energy distribution of plasma when used, in order to increase formation of a He metastable atom without correcting operation parameters of the plasma source. The control unit may include an electrical bias unit configured so as to apply a positive bias voltage to the object to pull in a free electron from the plasma. The system is previously mixed with He, or may include a supply source of supplement gas to be supplied from a further gas source. The supplement gas may be selected based on previous knowledge of types of a particle to be expected to be present on the surface of the object. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010087505(A) 申请公布日期 2010.04.15
申请号 JP20090213876 申请日期 2009.09.16
申请人 ASML NETHERLANDS BV 发明人 LUIGI SCACCABAROZZI;BANINE VADIM YEVGENYEVICH;KOSTER NORBERTUS BENEDICTUS;MOORS JOHANNES HUBERTUS JOSEPHINA;VAN KAMPEN MAARTEN;RAMASAMY RAJU;WAYNE M LYTLE;DAVID N RUZIC;MARTIN JOHN NEUMANN
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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