发明名称 PHASE CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a phase change memory device capable of properly controlling the heat radiation performance of a phase change region in writing information. SOLUTION: The phase change memory device 1 includes: a phase change region 15a; a first insulating layer 13 disposed below the phase change region 15a so as to contact the phase change region 15a; and a conductor layer 11 disposed below the first insulating layer 13 so as to contact the first insulating layer 13 and having at least partially disposed immediately below the phase change region 15a. The conductor layer 11 works as a heat sink of the phase change region 15a. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010087007(A) 申请公布日期 2010.04.15
申请号 JP20080251166 申请日期 2008.09.29
申请人 ELPIDA MEMORY INC 发明人 SEKO AKIYOSHI;SATO NATSUKI;ASANO ISAMU
分类号 H01L27/105;G11C13/00;H01L45/00 主分类号 H01L27/105
代理机构 代理人
主权项
地址