WAFER SCALE LENS, WAFER SCALE CAMERA MODULE AND ELECTRONIC DEVICE

摘要

A protruding section (11) which protrudes higher than the highest position of a lens optical surface (14) is formed outside the lens optical surface (14) on a lens wafer (1).  Thus, the lens wafer (1), a wafer scale camera module (100) and an electronic device, which can perform accurate imaging test, while eliminating lens breakage, are provided.