发明名称 Versatile system for conditioning slurry in CMP process
摘要 The present invention provides a system (100) for conditioning multi-component slurries utilized in chemical mechanical polishing (CMP) of semiconductor wafers (140). The system provides a first slurry component (108), and a second slurry component (120). A conditioning component (102) has first and second inlets, and an outlet operatively coupled to a dispensing system (138). First and second flow control components (116, 126) are operably intercoupled between the first and second inlets and the first and second slurry components, respectively. The system further provides a megasonic energy source (106), adapted to generate an energy field (118) across the conditioning component. A conveyance component (114) conducts the slurry components from the inlets through the energy field, and delivers a final mixture (136) of multi-component slurry to the outlet.
申请公布号 US7695589(B2) 申请公布日期 2010.04.13
申请号 US20040897286 申请日期 2004.07.21
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 STARK DAVID A.;SCHULTZ LAURENCE D.;MURPHY NEAL T.
分类号 C23F1/00;C09K3/14;H01L21/306 主分类号 C23F1/00
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