发明名称 Thermal properties measurement apparatus
摘要 A thermal property measurement apparatus capable of directly measuring thermal conductivity distribution in a ROI within a target only by measuring the temperature distribution that already exists in the ROI without generating other temperature fields artificially. The thermal property measurement apparatus includes a temperature detector for measuring temperatures at plural positions in the ROI, a distance controller for controlling a distance between the temperature detector and the target, a scanner for changing a relative position therebetween, a stage for putting the object thereon, a recorder for recording measured temperature data, position data and time data, a determination unit for determining whether at least one of thermal conductive phenomena and convection phenomena is dealt with or not, a processor for calculating thermal conductivity distribution in the ROI from the recorded data and temporal changeable references of the thermal conductivity in the ROI, and a controller.
申请公布号 US7690838(B2) 申请公布日期 2010.04.06
申请号 US20050110701 申请日期 2005.04.21
申请人 SUMI CHIKAYOSHI 发明人 SUMI CHIKAYOSHI
分类号 G01K3/08;G06F17/10;G06F17/13 主分类号 G01K3/08
代理机构 代理人
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