发明名称 Technique for aging induced performance drift compensation in an integrated circuit
摘要 An improved compensation circuit that compensates for lifetime performance drifts due to aging of integrated circuits to improve the circuit performance. In one example embodiment, this is achieved by applying a body bias voltage VBB to the integrated circuit to compensate for the lifetime performance drift due to hot carrier and NBTI induced aging.
申请公布号 US7689377(B2) 申请公布日期 2010.03.30
申请号 US20060562431 申请日期 2006.11.22
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 JAIN PALKESH;MAIR HUGH THOMAS
分类号 G06F19/00;G01R31/26;H01L21/00;H01L23/58 主分类号 G06F19/00
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