| 摘要 |
<p>Disclosed is a testing device, which tests a device under test and is equipped with a master domain, that possesses a master period signal generator that generates a master period signal, and that operates based on the master period signal, and a slave domain, that possesses a slave period signal generator that generates a slave period signal, and that operates based on the slave period signal, wherein the master period signal generator receives a control signal and resumes generation of the master period signal which had been held, and the slave period signal generator receives a control signal and initializes phase data of the slave period signal as well as resumes generation of the slave period signal which had been held.</p> |
