发明名称 Metal polishing slurry and chemical mechanical polishing method
摘要 The invention provides a metal polishing slurry containing a compound represented by the general formula (1): (X1)n-L wherein X1 represents a heterocycle containing at least one nitrogen atom, n represents an integer of 2 or more, and L represents a linking group having a valence of 2 or more, provided that X1s whose number is n may be the same or different, an oxidizer and an organic acid; and a method of chemical mechanical polishing using such slurry. The metal polishing slurry and the chemical mechanical polishing method are used in chemical mechanical polishing in the step of manufacturing semiconductor devices and enable a high polishing rate to be achieved while causing minimal dishing in polishing an object (wafer).
申请公布号 US2010075500(A1) 申请公布日期 2010.03.25
申请号 US20090382461 申请日期 2009.03.17
申请人 FUJIFILM CORPORATION 发明人 YOSHIKAWA MASARU;INABA TADASHI;INADA HIROSHI;TOMIGA TAKAMITSU
分类号 H01L21/463;B24B37/00;C07D249/04;C07D249/08;C09K3/14;C09K13/00;H01L21/304;H01L21/465 主分类号 H01L21/463
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