发明名称 |
NITRIDE SEMICONDUCTOR SUBSTRATE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor substrate that has low resistance and is excellent in crystallinity of a nitride semiconductor single-crystal layer without forming an SiN<SB>x</SB>layer between an Si substrate and the nitride semiconductor single-crystal layer formed thereupon, and to provide a method of manufacturing the same. Ž<P>SOLUTION: The nitride semiconductor substrate is manufactured through the processes of: forming a metal film consisting of one or more kinds between Ti and V on an Si (111) substrate 1; forming a nitride intermediate layer 2 consisting of one or more kinds among TiN, VN and a compound of the both by nitriding the metal film; and forming the nitride semiconductor single-crystal layer 3 consisting of one or more kinds among GaN (0001), AlN (0001) and InN (0001) on the nitride intermediate layer. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010062482(A) |
申请公布日期 |
2010.03.18 |
申请号 |
JP20080229194 |
申请日期 |
2008.09.08 |
申请人 |
COVALENT MATERIALS CORP |
发明人 |
ABE YOSHIHISA;KOMIYAMA JUN;OISHI KOJI;YOSHIDA AKIRA;ERIGUCHI KENICHI;SUZUKI SHUNICHI |
分类号 |
H01L21/205;C23C14/14;C23C16/34;C30B29/38;H01L21/20 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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地址 |
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