发明名称 SYSTEM AND METHOD RELATING TO EXAMINATION OF AN OBJECT
摘要 The present invention relates to a system and method for non-invasively examination of internal structures of an object by producing dielectric images utilizing reflection and transmission 5 measurements using microwave radiation, characterized by an antenna array surrounding a region of interest for the examination, a microwave transceiver for measuring reflected and transmitted electromagnetic fields, a computational module for receiving detected radiation and for processing data based on the detected radiation, the computational module further being operatively arranged to execute a reconstruction procedure utilized to compute an image of the 10 dielectric profile under detection.
申请公布号 US2010067770(A1) 申请公布日期 2010.03.18
申请号 US20070302055 申请日期 2007.05.22
申请人 MEDFIELDS DIAGNOSTICS AB 发明人 PERSSON MIKAEL;PHAGER ANDREAS;HASHEMZADEH PARHAM
分类号 G06K9/00 主分类号 G06K9/00
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