发明名称 SELF-DIAGNOSTIC CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To provide a self-diagnostic circuit which can perform self-diagnosis without installing a plurality of the same circuits. Ž<P>SOLUTION: A processing signal and a standard signal can be input alternatively into a signal processing circuit 40 by switching between a first switch 30 and a second switch 50 according to a clock signal. Further, an abnormality is determined based on a determination signal which is generated by processing the standard signal in the signal processing circuit 40. Thereby, the self-diagnosis can be performed without having in excess of the signal processing circuit 40 for the self-diagnosis. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010060498(A) 申请公布日期 2010.03.18
申请号 JP20080228357 申请日期 2008.09.05
申请人 DENSO CORP 发明人 AZEYANAGI SUSUMU
分类号 G01R31/28 主分类号 G01R31/28
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