发明名称 METHOD FOR BONDING PROBE
摘要 PURPOSE: A method for bonding probes is provided to perform an arrangement for neighboring probes by bonding the probes to an interconnection element on the circuit pattern of a substrate. CONSTITUTION: A substrate on which a circuit pattern is formed is prepared(S100). An interconnection element including a first side and a second side is prepared(S200). The interconnection element is bonded to the circuit pattern(S300). The second side of the interconnection element is polished(S500). Probes are arranged on the second side. Probes are bonded to the interconnection element(S700).
申请公布号 KR20100027740(A) 申请公布日期 2010.03.11
申请号 KR20080086768 申请日期 2008.09.03
申请人 WILL TECHNOLOGY CO., LTD. 发明人 HAN, JEONG SEOB
分类号 H01L21/60;H01L21/66 主分类号 H01L21/60
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