APPARATUS AND METHOD FOR GENERATING RESISTANCE VALUE CALIBRATION CODE OF SEMICONDUCTOR INTEGRATED CIRCUIT,申请号KR20080077710-传众专利搜索

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发明名称	APPARATUS AND METHOD FOR GENERATING RESISTANCE VALUE CALIBRATION CODE OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号	KR100945813(B1)	申请公布日期	2010.03.08
申请号	KR20080077710	申请日期	2008.08.08
申请人		发明人
分类号	G11C7/10;G11C7/22	主分类号	G11C7/10
代理机构		代理人
主权项
地址

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