发明名称 PHASE CHANGE MEMORY STRUCTURE WITH MULTIPLE RESISTANCE STATES AND METHODS OF PROGRAMMING AND SENSING SAME
摘要 <p>A phase change memory structure with multiple resistance states and methods of forming, programming, and sensing the same. The memory structure includes two or more phrase change elements provided between electrodes. Each phase change element has a respective resistance curve as a function of programming voltage which is shifted relative to the resistance curves of other phase change elements. In one example structure using two phase change elements, the memory structure is capable of switching among four resistance states.</p>
申请公布号 KR20100020489(A) 申请公布日期 2010.02.22
申请号 KR20097027206 申请日期 2008.04.11
申请人 MICRON TECHNOLOGY, INC. 发明人 LIU JUN;VIOLETTE MIKE
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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