| 摘要 |
PURPOSE: An apparatus and a method for measuring defects of a strip are provided to accurately detect the position and the surface defects of a strip in consideration of the width direction variance of the strips. CONSTITUTION: A method for measuring defects of a strip comprises following steps. The image of the obtained strip surface is analyzed and the variance toward the strip width direction is measured(S30,S40). According to variance toward the strip width direction measured, the phase of image is transited(S32,S42). The surface defects of the strip are detected by comparing the image which has the transited phase with a reference image(S38,S48).
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