| 摘要 |
<P>PROBLEM TO BE SOLVED: To test a device to be tested with accuracy, at high speed, while simplifying a circuit configuration and a circuit amount. Ž<P>SOLUTION: A semiconductor testing device equipped with a plurality of CPUs 1, for testing a DUT, is equipped with: each data generation part 14 provided in each CPU 1 for generating interruption request data for requesting interruption to another CPU 1; an interrupt control part 2 for inputting the interrupt request data from each data generating part 14, and controlling the generation of interruption to another CPU 1; and each serial bus 30, provided on each data generation part 14 for connecting respectively each data generation part 14 to the interrupt control part 2, and performing serial transfer of the interrupt request data as serial data. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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