发明名称 MASS ANALYZER AND MASS ANALYZING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a mass analyzer increased in the number of the peaks of detectable fragment ions and using electron capture dissociation. Ž<P>SOLUTION: The mass analyzer is equipped with an ion source 2 for forming ions from a sample, an ion trapping part 3 for performing the accumulation and selection of the ions, an ion dissociation part 4 for performing the electron capture dissociation of the ions and a flight time mass analyzing part 7 for performing the mass analysis of the ions. The reaction time of electron capture dissociation is variable according to the valency of the ions subjected to mass analysis. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010032227(A) 申请公布日期 2010.02.12
申请号 JP20080191580 申请日期 2008.07.25
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YOSHIOKA SHINJI;TAKEDA AKIHIRO;SHISHIKA TSUKASA
分类号 G01N27/64;H01J49/06;H01J49/40;H01J49/42 主分类号 G01N27/64
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