发明名称 |
MASS ANALYZER AND MASS ANALYZING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a mass analyzer increased in the number of the peaks of detectable fragment ions and using electron capture dissociation. Ž<P>SOLUTION: The mass analyzer is equipped with an ion source 2 for forming ions from a sample, an ion trapping part 3 for performing the accumulation and selection of the ions, an ion dissociation part 4 for performing the electron capture dissociation of the ions and a flight time mass analyzing part 7 for performing the mass analysis of the ions. The reaction time of electron capture dissociation is variable according to the valency of the ions subjected to mass analysis. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010032227(A) |
申请公布日期 |
2010.02.12 |
申请号 |
JP20080191580 |
申请日期 |
2008.07.25 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
YOSHIOKA SHINJI;TAKEDA AKIHIRO;SHISHIKA TSUKASA |
分类号 |
G01N27/64;H01J49/06;H01J49/40;H01J49/42 |
主分类号 |
G01N27/64 |
代理机构 |
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地址 |
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