发明名称 |
SYSTEM AND METHOD FOR MEASURING REFLECTANCE OF OBJECT |
摘要 |
There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.
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申请公布号 |
US2010033721(A1) |
申请公布日期 |
2010.02.11 |
申请号 |
US20090536292 |
申请日期 |
2009.08.05 |
申请人 |
GWANGJI INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
LEE KWAN HENG;KIM DUCK BONG;PARK KANG SU;KIM KANG YEON;SEO MYOUNG KOOK |
分类号 |
G01N21/55;G01J3/52 |
主分类号 |
G01N21/55 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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