The present invention relates to SPM nanoprobes and the preparation method thereof, more particularly, to SPM nanoprobes comprising a spheroid deposit capped-nanoneedle bonded to one end of a mother tip, wherein the spheroid deposit is formed by particle beam induced deposition and is characterized in that the ratio of the diameter of the spheroid deposit to that of the nanoneedle is in the range of 1.5 to 8.5. The SPM nanoprobe according to the present invention is capable of imaging or measuring a irregularly curved or complicated surface, pattern and/or a frictional or adhesive force thereof and controlling size of a spheroid deposit formed at the end portion of nanoneedle and the ratio of the diameter of the spheroid deposit to that of the nanoneedle arbitrarily.
申请公布号
WO2010013977(A2)
申请公布日期
2010.02.04
申请号
WO2009KR04300
申请日期
2009.07.31
申请人
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE;AN, SANG JUNG;PARK, BUONG CHON;KAHNG, YUNG-HO;CHOI, JIN HO;JEONG, KWANG HOON
发明人
AN, SANG JUNG;PARK, BUONG CHON;KAHNG, YUNG-HO;CHOI, JIN HO;JEONG, KWANG HOON