发明名称 Surface texture measuring instrument and measuring method
摘要 A surface texture measuring instrument includes: a measuring device (4) that includes a detector (42) for detecting surface texture of a workpiece (W) and an X-axis movement mechanism (41) for moving the detector (42) in a measurement direction; an elevation inclination adjuster (5) capable of adjusting an elevation position and an inclination angle of a table (52) on which the measuring device (4) is mounted; a stage (3) on which the workpiece (W) is mounted; and a controller (6) that controls the measuring device (4) and the elevation inclination adjuster (5). The controller (6) includes: a measurement controller (62) that controls the X-axis movement mechanism (41) to conduct a preliminary measurement and main measurement of the workpiece (W); a computing unit (65) that acquires a result of the preliminary measurement from the detector (42) and obtains an inclination angle of the workpiece (W) at which the workpiece (W) is inclined to the measurement direction; and a positioning controller (64) for adjusting the inclination angle of the table (52) based on the obtained inclination angle.
申请公布号 EP2149774(A1) 申请公布日期 2010.02.03
申请号 EP20090166419 申请日期 2009.07.27
申请人 MITUTOYO CORPORATION 发明人 KANEMATSU, TOSHIHIRO;MISHIMA, HIDEKI;HAMA, NOBUYUKI
分类号 G01B5/00;B23Q1/54;G01B5/20;G01B5/28 主分类号 G01B5/00
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