发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve reliability by preventing a metal element from being diffused to an intermediate layer arranged on a conductive layer. CONSTITUTION: An intermediate layer(20) is formed on a substrate(10). An opening is formed on the intermediate layer. A conductive layer(30) is formed on the opening. A cap film is formed on a surface of the conductive layer. When forming the cap film, the reduction process of the surface of the conductive layer and the film formation process are performed at the same.
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申请公布号 |
KR20100011899(A) |
申请公布日期 |
2010.02.03 |
申请号 |
KR20090055994 |
申请日期 |
2009.06.23 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
MATSUOKA TAKAAKI;IDE SHINJI;KIKUCHI YOSHIYUKI |
分类号 |
H01L21/3205;H01L21/768;H01L23/52 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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