发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve reliability by preventing a metal element from being diffused to an intermediate layer arranged on a conductive layer. CONSTITUTION: An intermediate layer(20) is formed on a substrate(10). An opening is formed on the intermediate layer. A conductive layer(30) is formed on the opening. A cap film is formed on a surface of the conductive layer. When forming the cap film, the reduction process of the surface of the conductive layer and the film formation process are performed at the same.
申请公布号 KR20100011899(A) 申请公布日期 2010.02.03
申请号 KR20090055994 申请日期 2009.06.23
申请人 TOKYO ELECTRON LIMITED 发明人 MATSUOKA TAKAAKI;IDE SHINJI;KIKUCHI YOSHIYUKI
分类号 H01L21/3205;H01L21/768;H01L23/52 主分类号 H01L21/3205
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